Müller-Buschbaum P
Physik Department LS E13, TU München, James-Franck-Str.1, 85747 Garching, Germany.
Anal Bioanal Chem. 2003 May;376(1):3-10. doi: 10.1007/s00216-003-1869-2. Epub 2003 Mar 29.
Hamburg workshop on the "application of synchrotron radiation in chemistry"With grazing incidence small-angle X-ray scattering (GISAXS) the limitations of conventional small-angle X-ray scattering with respect to extremely small sample volumes in the thin-film geometry are overcome. GISAXS turned out to be a powerful advanced scattering technique for the investigation of nanostructured polymer films. Similar to atomic force microscopy (AFM), a large interval of length between molecular and mesoscopic scales is detectable with a surface-sensitive scattering method. While with AFM only surface topographies are accessible, with GISAXS the buried structure is also probed. Because a larger surface area is probed, GISAXS also has a much larger statistical significance compared to AFM. Due to the high demand on collimation, GISAXS experiments are based on synchrotron radiation. Nanostructures parallel and perpendicular to the sample surface observable in thin poly(styrene- block-isoprene) diblock copolymer films are presented as an example of the possibilities of GISAXS.
汉堡“同步辐射在化学中的应用”研讨会
采用掠入射小角X射线散射（GISAXS）技术，克服了传统小角X射线散射在薄膜几何结构中处理极少量样品时的局限性。事实证明，GISAXS是一种用于研究纳米结构聚合物薄膜的强大先进散射技术。与原子力显微镜（AFM）类似，通过一种表面敏感散射方法可以检测分子尺度和介观尺度之间的大长度区间。AFM只能获取表面形貌，而GISAXS还能探测埋藏结构。由于探测的表面积更大，与AFM相比，GISAXS也具有更大的统计意义。由于对准直要求很高，GISAXS实验基于同步辐射。以聚（苯乙烯-嵌段-异戊二烯）二嵌段共聚物薄膜中可观察到的平行和垂直于样品表面的纳米结构为例，展示了GISAXS的应用可能性。
