Mitterbauer C, Kothleitner G, Grogger W, Zandbergen H, Freitag B, Tiemeijer P, Hofer F
Research Institute for Electron Microscopy, Graz University of Technology, Graz A-8010, Austria.
Ultramicroscopy. 2003 Sep;96(3-4):469-80. doi: 10.1016/S0304-3991(03)00109-8.
Near-edge fine structures of the metal L(2,3) and O K-edges in transition metal-oxides have been studied with a transmission electron microscope equipped with a monochromator and a high-resolution imaging filter. This system enables the recording of EELS spectra with an energy resolution of 0.1eV thus providing new near-edge fine structure details which could not be observed previously by EELS in conventional TEM instruments. EELS-spectra from well-defined oxides like titanium oxide (TiO(2)), vanadium oxide (V(2)O(5)), chromium oxide (Cr(2)O(3)), iron oxide (Fe(2)O(3)), cobalt oxide (CoO) and nickel oxide (NiO) have been measured with the new system. These spectra are compared with EELS data obtained from a conventional microscope and the main spectral features are interpreted. Additionally, the use of monochromised TEMs is discussed in view of the natural line widths of K and L(2,3) edges.
利用配备单色仪和高分辨率成像滤波器的透射电子显微镜，对过渡金属氧化物中金属L(2,3)边和O K边的近边精细结构进行了研究。该系统能够记录能量分辨率为0.1eV的电子能量损失谱（EELS），从而提供了传统透射电子显微镜（TEM）仪器中EELS以前无法观察到的新的近边精细结构细节。使用该新系统测量了来自氧化钛（TiO(2)）、五氧化二钒（V(2)O(5)）、三氧化二铬（Cr(2)O(3)）、氧化铁（Fe(2)O(3)）、氧化钴（CoO）和氧化镍（NiO）等明确氧化物的EELS谱。将这些谱与从传统显微镜获得的EELS数据进行比较，并对主要光谱特征进行了解释。此外，鉴于K边和L(2,3)边的自然线宽，还讨论了单色化TEM的使用。
