Olszta M J, Wang J, Dickey E C
Department of Materials Science and Engineering, Center for Dielectric Studies and The Materials Research Institute, 208 MRL Building, Pennsylvania State University, University Park, Pennsylvania 16802, USA.
J Microsc. 2006 Dec;224(Pt 3):233-41. doi: 10.1111/j.1365-2818.2006.01709.x.
Qualitative and quantitative electron energy-loss spectroscopy analyses have been performed on niobium and stable niobium oxides (NbO, NbO(2) and Nb(2)O(5)). At integration windows (Delta) greater than 75 eV, k-factor analysis can be used to distinguish between the stoichiometry of the three oxides within 5.7% error. As seen in other metal oxides, with increasing oxidation state the metal ionization edges shift to higher energies relative to the O-K edge. Normalized M(2,3) white-line intensities show a strong correlation with 4d occupancy for each compound. The data are in correspondence with that observed in the literature for 4d transition metals using normalized L(2,3) white lines. Lastly, a distinctive energy-loss near-edge, structure of the O-K edge was observed for each oxide, which could be used as a fingerprint for analysis of unknowns.