Wang Y Y, Zhang H, Dravid V P
Department of Materials Science & Engineering, Northwestern University, Evanston, Illinois 60208, USA.
Microsc Res Tech. 1995 Feb 15;30(3):208-17. doi: 10.1002/jemt.1070300303.
Electron energy loss spectrometry (EELS) with a cold field emission gun (cFEG) transmission electron microscope (TEM) is implemented to analyze the evolution of the electronic structure and dielectric function of oxide superconductors. The O-K core loss spectra of p-type doped oxide superconductors are analyzed in terms of holes formation on oxygen sites, while low loss spectra are analyzed for free carrier plasmas, other spectral excitations, and their crystallographic confinement. It is illustrated that the transmission EELS with a cFEG TEM very much complement soft X-ray absorption spectroscopy and optical spectroscopy, with the added advantages of high spatial resolution (approximately 1-100 nm), and is compatible with other analytical, diffraction, and imaging techniques, which are readily available in a cFEG TEM.
利用配备冷场发射枪（cFEG）的透射电子显微镜（TEM）进行电子能量损失谱（EELS）分析，以研究氧化物超导体的电子结构和介电函数的演变。从氧位点上的空穴形成角度分析了p型掺杂氧化物超导体的O-K核心损失谱，同时针对自由载流子等离子体、其他光谱激发及其晶体学限制分析了低损失谱。结果表明，配备cFEG的透射EELS与软X射线吸收光谱和光学光谱互为补充，具有高空间分辨率（约1 - 100 nm）的额外优势，并且与cFEG TEM中现有的其他分析、衍射和成像技术兼容。
