Crook Rolf, Graham Abi C, Smith Charles G, Farrer Ian, Beere Harvey E, Ritchie David A
Department of Physics, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK.
Nature. 2003 Aug 14;424(6950):751-4. doi: 10.1038/nature01841.
Quantum electronic components--such as quantum antidots and one-dimensional channels--are usually defined from doped GaAs/AlGaAs heterostructures using electron-beam lithography or local oxidation by conductive atomic force microscopy. In both cases, lithography and measurement are performed in very different environments, so fabrication and test cycles can take several weeks. Here we describe a different lithographic technique, which we call erasable electrostatic lithography (EEL), where patterns of charge are drawn on the device surface with a negatively biased scanning probe in the same low-temperature high-vacuum environment used for measurement. The charge patterns locally deplete electrons from a subsurface two-dimensional electron system (2DES) to define working quantum components. Charge patterns are erased locally with the scanning probe biased positive or globally by illuminating the device with red light. We demonstrate and investigate EEL by drawing and erasing quantum antidots, then develop the technique to draw and tune high-quality one-dimensional channels. The quantum components are imaged using scanned gate microscopy. A technique similar to EEL has been reported previously, where tip-induced charging of the surface or donor layer was used to locally perturb a 2DES before charge accumulation imaging.
量子电子元件——比如量子点和一维通道——通常是通过电子束光刻或导电原子力显微镜局部氧化,由掺杂的砷化镓/铝镓砷异质结构来定义的。在这两种情况下,光刻和测量都是在非常不同的环境中进行的,所以制造和测试周期可能需要几周时间。在这里,我们描述一种不同的光刻技术,我们称之为可擦除静电光刻(EEL),其中电荷图案是在用于测量的相同低温高真空环境中,用负偏置扫描探针在器件表面绘制的。电荷图案会局部耗尽表面下二维电子系统(2DES)中的电子,以定义工作量子元件。电荷图案可以通过将扫描探针偏置为正进行局部擦除,或者通过用红光照射器件进行全局擦除。我们通过绘制和擦除量子点来演示和研究EEL,然后开发该技术来绘制和调谐高质量的一维通道。使用扫描门显微镜对量子元件进行成像。之前已经报道过一种与EEL类似的技术,其中在电荷积累成像之前,利用尖端诱导的表面或施主层充电来局部扰动二维电子系统。