Liu Ying, Li Fu-tian
State Key Laboratory of Applied Optics, Changchun Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Changchun 130022, China.
Guang Pu Xue Yu Guang Pu Fen Xi. 2002 Aug;22(4):552-5.
A method of determinating the degree of polarization of grating, polarizer and analyzer at some wavelength is introduced. The degrees of polarization of LiF polarizers were determined with 1 m Seya-Namioka monochromator by this way. The source is hollow cathode source. The degrees of polarization of two, four and eight LiF plates were measured at 120, 149.2, 174.2, 214.2, 235.0, 300 and 340 nm. The theoretical and experimental reults were consistent within the error. The angular extinction dependence of the LiF polarizer and analyzer was measured at VUV wavelengths. The results showed the expected cosine square dependence, so a high degree of polarization was indeed produced. Also, the LiF polarizer was used to measure the polarization characters of the Al + MgF2 reflectance and the absolute grating efficiency at both parallel and perpendicular to their incident plane.
介绍了一种在某些波长下测定光栅、偏振器和检偏器偏振度的方法。用1米的塞亚-南米oka单色仪以此方法测定了LiF偏振器的偏振度。光源是空心阴极光源。在120、149.2、174.2、214.2、235.0、300和340纳米处测量了两块、四块和八块LiF板的偏振度。理论和实验结果在误差范围内一致。在真空紫外波长下测量了LiF偏振器和检偏器的角消光依赖性。结果显示出预期的余弦平方依赖性,因此确实产生了高度偏振。此外,LiF偏振器用于测量Al + MgF2反射率在平行和垂直于其入射平面时的偏振特性以及绝对光栅效率。