Tao D L, Huang B G, Xu Y Z, Li W H, Yang Z L, Wu J G, Sun L D, Yan C H, Liu X X, Guo F X, Xu D F
Department of Chemistry, State Key Laboratory of Rare Earth Materials Chemistry and Applications, Peking University, Beijing 100871, China.
Guang Pu Xue Yu Guang Pu Fen Xi. 2001 Dec;21(6):740-4.
A chloroform-soluble terbium complex, which is confirmed to be Tb(aspirin)3 phen using element analysis and FT-IR spectroscopy, was synthesized. Photoluminescent investigation on the terbium complex and PVK-terbium complex composite was conducted. Förster energy transfer occurred between the terbium complex and the PVK matrix. There are no overlap between UV spectrum of the complex and the emission spectrum of PVK, however, overlap is observed between the excitation spectrum of the complex and the emission spectrum of PVK. Therefore, we suggest that the necessary condition of Förster energy transfer should be overlap between the excitation (not UV) spectrum of one complex and the emission spectrum of polymer matrix. Further investigation indicates that the emission of PVK can be suppressed at different extents by doping various amount of Tb(aspirin)3 phen into PVK films. The ratio of Tb(aspirin)3 phen: PVK = 1:2 (wt%) are regarded as an optimized ratio for limiting the emission of PVK. TEM images of PVK/Tb(aspirin)3 phen films reveal that nanoparticles of the Tb complex are dispersed in the PVK matrix. The size of the aggregated complex in PVK matrix is 20-30 nm. The film is not homogeneous as dark regions co-exist with light region in the TEM images. This phenomenon may be related to the short lifetime of electroluminescent devices.
合成了一种可溶于氯仿的铽配合物,通过元素分析和傅里叶变换红外光谱证实其为Tb(阿司匹林)3菲咯啉。对铽配合物和聚(N-乙烯基咔唑)-铽配合物复合材料进行了光致发光研究。铽配合物与聚(N-乙烯基咔唑)基质之间发生了福斯特能量转移。配合物的紫外光谱与聚(N-乙烯基咔唑)的发射光谱没有重叠,然而,观察到配合物的激发光谱与聚(N-乙烯基咔唑)的发射光谱有重叠。因此,我们认为福斯特能量转移的必要条件应该是一种配合物的激发(非紫外)光谱与聚合物基质的发射光谱之间的重叠。进一步研究表明,通过在聚(N-乙烯基咔唑)薄膜中掺杂不同量的Tb(阿司匹林)3菲咯啉,可以不同程度地抑制聚(N-乙烯基咔唑)的发射。Tb(阿司匹林)3菲咯啉与聚(N-乙烯基咔唑)的比例为1:2(重量%)被认为是限制聚(N-乙烯基咔唑)发射的最佳比例。聚(N-乙烯基咔唑)/Tb(阿司匹林)3菲咯啉薄膜的透射电子显微镜图像显示,铽配合物的纳米颗粒分散在聚(N-乙烯基咔唑)基质中。聚(N-乙烯基咔唑)基质中聚集配合物的尺寸为20-30纳米。在透射电子显微镜图像中,薄膜不均匀,因为暗区与亮区共存。这种现象可能与电致发光器件的短寿命有关。