Suppr超能文献

由基因座重复和缺失导致的小麦同源染色体间的共线性扰动与重组率相关。

Synteny perturbations between wheat homoeologous chromosomes caused by locus duplications and deletions correlate with recombination rates.

作者信息

Akhunov Eduard D, Akhunova Alina R, Linkiewicz Anna M, Dubcovsky Jorge, Hummel David, Lazo Gerry, Chao Shiaoman, Anderson Olin D, David Jacques, Qi Lili, Echalier Benjamin, Gill Bikram S, Gustafson J Perry, La Rota Mauricio, Sorrells Mark E, Zhang Deshui, Nguyen Henry T, Kalavacharla Venugopal, Hossain Khwaja, Kianian Shahryar F, Peng Junhua, Lapitan Nora L V, Wennerlind Emily J, Nduati Vivienne, Anderson James A, Sidhu Deepak, Gill Kulvinder S, McGuire Patrick E, Qualset Calvin O, Dvorak Jan

机构信息

Department of Agronomy and Range Science, University of California, Davis, CA 95616, USA.

出版信息

Proc Natl Acad Sci U S A. 2003 Sep 16;100(19):10836-41. doi: 10.1073/pnas.1934431100. Epub 2003 Sep 5.

Abstract

Loci detected by Southern blot hybridization of 3,977 expressed sequence tag unigenes were mapped into 159 chromosome bins delineated by breakpoints of a series of overlapping deletions. These data were used to assess synteny levels along homoeologous chromosomes of the wheat A, B, and D genomes, in relation to both bin position on the centromere-telomere axis and the gradient of recombination rates along chromosome arms. Synteny level decreased with the distance of a chromosome region from the centromere. It also decreased with an increase in recombination rates along the average chromosome arm. There were twice as many unique loci in the B genome than in the A and D genomes, and synteny levels between the B genome chromosomes and the A and D genome homoeologues were lower than those between the A and D genome homoeologues. These differences among the wheat genomes were attributed to differences in the mating systems of wheat diploid ancestors. Synteny perturbations were characterized in 31 paralogous sets of loci with perturbed synteny. Both insertions and deletions of loci were detected and both preferentially occurred in high recombination regions of chromosomes.

摘要

通过对3977个表达序列标签单基因进行Southern杂交检测到的基因座,被定位到由一系列重叠缺失的断点所界定的159个染色体区间中。这些数据用于评估小麦A、B和D基因组同源染色体上的同线性水平,这与着丝粒 - 端粒轴上的区间位置以及染色体臂上重组率的梯度有关。同线性水平随着染色体区域与着丝粒距离的增加而降低。它也随着沿平均染色体臂重组率的增加而降低。B基因组中的独特基因座数量是A和D基因组中的两倍,并且B基因组染色体与A和D基因组同源染色体之间的同线性水平低于A和D基因组同源染色体之间的同线性水平。小麦基因组之间的这些差异归因于小麦二倍体祖先交配系统的差异。在31组具有同线性扰动的旁系同源基因座中对同线性扰动进行了表征。检测到基因座的插入和缺失,并且两者都优先发生在染色体的高重组区域。

相似文献

8
Gene evolution at the ends of wheat chromosomes.小麦染色体末端的基因进化。
Proc Natl Acad Sci U S A. 2006 Mar 14;103(11):4162-7. doi: 10.1073/pnas.0508942102. Epub 2006 Mar 6.

引用本文的文献

2
Fine mapping of a stripe rust resistance gene YrZM175 in bread wheat.面包小麦中抗条锈病基因YrZM175的精细定位
Theor Appl Genet. 2022 Oct;135(10):3485-3496. doi: 10.1007/s00122-022-04195-9. Epub 2022 Aug 20.
3
Evolution and origin of bread wheat.小麦的进化和起源。
Plant Cell. 2022 Jul 4;34(7):2549-2567. doi: 10.1093/plcell/koac130.
4
JBrowse Connect: A server API to connect JBrowse instances and users.JBrowse Connect:连接 JBrowse 实例和用户的服务器 API。
PLoS Comput Biol. 2020 Aug 18;16(8):e1007261. doi: 10.1371/journal.pcbi.1007261. eCollection 2020 Aug.
10
Are duplicated genes responsible for anthracnose resistance in common bean?重复基因是否与菜豆对炭疽病的抗性有关?
PLoS One. 2017 Mar 15;12(3):e0173789. doi: 10.1371/journal.pone.0173789. eCollection 2017.

本文引用的文献

3
Construction of an RFLP map of barley.大麦 RFLP 图谱的构建。
Theor Appl Genet. 1991 Dec;83(2):250-6. doi: 10.1007/BF00226259.

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验