Lee Chau-Hwang, Chiang Hui-Yu, Mong Hong-Yao
Institute of Applied Science and Engineering Research, Academia Sinica, 128 Academia Road, Section 2, Nankang, Taipei 115, Taiwan.
Opt Lett. 2003 Oct 1;28(19):1772-4. doi: 10.1364/ol.28.001772.
Using the nanometer depth sensitivity of differential confocal microscopy, we detect surface features of lateral dimensions smaller than the diffraction limit without fluorescence labeling. The lateral resolution of the topographic images is further enhanced by a maximum-likelihood estimation algorithm. Based on the comparison of signal and noise at high spatial frequency, we estimate the best lateral resolution of the enhanced images to be 0.15 lambda. In addition, on composite samples this technique can simultaneously display sub-diffraction-limit topographic features and reflectivity heterogeneity.
利用差分共聚焦显微镜的纳米深度灵敏度，我们无需荧光标记就能检测横向尺寸小于衍射极限的表面特征。通过最大似然估计算法进一步提高了地形图像的横向分辨率。基于高空间频率下信号与噪声的比较，我们估计增强图像的最佳横向分辨率为0.15λ。此外，对于复合样品，该技术可以同时显示亚衍射极限的地形特征和反射率异质性。
