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Nanowires and nanorings at the atomic level.

作者信息

Kawamura Midori, Paul Neelima, Cherepanov Vasily, Voigtländer Bert

机构信息

Institut für Schichten und Grenzflächen ISG 3, Forschungszentrum Jülich, 52425 Jülich, Germany.

出版信息

Phys Rev Lett. 2003 Aug 29;91(9):096102. doi: 10.1103/PhysRevLett.91.096102. Epub 2003 Aug 28.

Abstract

The step-flow growth mode is used to fabricate Si and Ge nanowires with a width of 3.5 nm and a thickness of one atomic layer (0.3 nm) by self-assembly. Alternating deposition of Ge and Si results in the formation of a nanowire superlattice covering the whole surface. One atomic layer of Bi terminating the surface is used to distinguish between the elements Si and Ge. A difference in apparent height is measured in scanning tunneling microscopy images for Si and Ge. Also, different kinds of two-dimensional Si/Ge nanostructures like alternating Si and Ge nanorings having a width of 5-10 nm were grown.

摘要

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