Kawamura Midori, Paul Neelima, Cherepanov Vasily, Voigtländer Bert
Institut für Schichten und Grenzflächen ISG 3, Forschungszentrum Jülich, 52425 Jülich, Germany.
Phys Rev Lett. 2003 Aug 29;91(9):096102. doi: 10.1103/PhysRevLett.91.096102. Epub 2003 Aug 28.
The step-flow growth mode is used to fabricate Si and Ge nanowires with a width of 3.5 nm and a thickness of one atomic layer (0.3 nm) by self-assembly. Alternating deposition of Ge and Si results in the formation of a nanowire superlattice covering the whole surface. One atomic layer of Bi terminating the surface is used to distinguish between the elements Si and Ge. A difference in apparent height is measured in scanning tunneling microscopy images for Si and Ge. Also, different kinds of two-dimensional Si/Ge nanostructures like alternating Si and Ge nanorings having a width of 5-10 nm were grown.