Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany.
Phys Rev Lett. 2012 Mar 16;108(11):116101. doi: 10.1103/PhysRevLett.108.116101. Epub 2012 Mar 12.
Selective adsorption of C60 on nanoscale Ge areas can be achieved, while neighboring Si(111) areas remain uncovered, if the whole surface is initially terminated by Bi. Fullerene chemisorption is found at Bi vacancies which form due to partial thermal desorption of the Bi surfactant. The growth rate and temperature dependence of the C60 adsorption were measured using scanning tunneling microscopy and are described consistently by a rate equation model. The selectivity of the C60 adsorption can be traced back to an easier vacancy formation in the Bi layer on top of the Ge areas compared to the Si areas. Furthermore, it is also possible to desorb C60 from Ge areas, allowing the use of C60 as a resist on the nanoscale.
如果整个表面最初由 Bi 终止,则可以实现 C60 在纳米级 Ge 区域上的选择性吸附,而相邻的 Si(111) 区域则保持未覆盖。富勒烯化学吸附发生在由于 Bi 表面活性剂的部分热解吸而形成的 Bi 空位处。使用扫描隧道显微镜测量了 C60 吸附的生长速率和温度依赖性,并通过速率方程模型一致地描述。C60 吸附的选择性可以追溯到与 Si 区域相比,Ge 区域顶部的 Bi 层中更容易形成空位。此外,还可以从 Ge 区域解吸 C60,从而允许在纳米尺度上使用 C60 作为抗蚀剂。