Moser Andreas, Berger Andreas, Margulies David T, Fullerton Eric E
San Jose Research Center, Hitachi Global Storage Technologies, 650 Harry Road, San Jose, California 95120, USA.
Phys Rev Lett. 2003 Aug 29;91(9):097203. doi: 10.1103/PhysRevLett.91.097203.
The effective interlayer coupling between antiferromagnetically coupled hard and soft ferromagnetic thin films is investigated as a function of the magnetic bit length in the hard layer, which is controlled using a magnetic recording system. The interlayer coupling is explored by studying the magnetization reversal of the soft layer. As the bit length decreases, the coupling evolves from antiferromagnetic to biquadratic to uncoupled. These results are reproduced using a micromagnetic model and determine the applicability range of Slonczewski's fluctuation model of biquadratic coupling.
研究了反铁磁耦合的硬磁和软磁铁磁薄膜之间的有效层间耦合与硬磁层中磁比特长度的函数关系，该磁比特长度通过磁记录系统进行控制。通过研究软磁层的磁化反转来探索层间耦合。随着比特长度的减小，耦合从反铁磁演变为双二次型再到非耦合。使用微磁模型再现了这些结果，并确定了双二次耦合的斯隆采夫斯基涨落模型的适用范围。
