Prins Steven L, Barron Alan C, Herrmann William C, McNeil John R
Agere Systems, Dallas, Texas 75238, USA.
Appl Opt. 2004 Jan 20;43(3):626-32. doi: 10.1364/ao.43.000626.
Thin-film filters used for dense wavelength division multiplexing (DWDM) applications are processed by a variety of deposition techniques, including ion-beam sputtering. Ion-beam sputtering produces high-quality coatings and provides flexibility of coating materials. However, DWDM filters consisting of oxide films that are reactively deposited by ion-beam sputtering, as in most sputter techniques, typically exhibit high levels of compressive stress. This affects the optical characteristics of the filters. Details of the filter passband characteristics and wave-front distortion illustrate the influence of the stress. Spatial variation of the stress on the filter surface causes the filter center wavelength to have spatial variation, and it causes the filter to have an asymmetric passband characteristic.
用于密集波分复用(DWDM)应用的薄膜滤波器是通过多种沉积技术加工而成的,包括离子束溅射。离子束溅射可产生高质量的涂层,并提供涂层材料的灵活性。然而,与大多数溅射技术一样,由离子束溅射反应沉积的氧化膜组成的DWDM滤波器通常表现出高水平的压应力。这会影响滤波器的光学特性。滤波器通带特性和波前畸变的细节说明了应力的影响。滤波器表面应力的空间变化会导致滤波器中心波长产生空间变化,并使滤波器具有不对称的通带特性。