Banzhof H, Herrmann K H, Lichte H
Institute for Applied Physics, University of Tübingen, Germany.
Microsc Res Tech. 1992 Feb 15;20(4):450-6. doi: 10.1002/jemt.1070200414.
Two beam interferences produced using an electrostatic biprism, which is inserted in the position of the selected area diaphragm of a commercial electron microscope, may be used in reflection electron microscopy to determine the phase shifts induced by structures on single crystal surfaces. A description of our interferometrical and holographical experiments on the phase shift at steps on (111)Au and (111)Pt single crystal surfaces is given and a straight forward interpretation of the results in terms of refraction will be discussed. As a particular result phase shifts of pi and 0.9 pi were measured for monatomic steps on (111)gold and (111)platinum surfaces, respectively.
使用插入商用电子显微镜选区光阑位置的静电双棱镜产生的双束干涉,可用于反射电子显微镜中,以确定单晶表面结构引起的相移。本文给出了我们对(111)金和(111)铂单晶表面台阶处相移的干涉测量和全息实验描述,并将讨论根据折射对结果进行的直接解释。特别地,分别测量了(111)金和(111)铂表面单原子台阶的π和0.9π相移。