Freitag Marcus, Chen Jia, Tersoff J, Tsang James C, Fu Qiang, Liu Jie, Avouris Phaedon
IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598, USA.
Phys Rev Lett. 2004 Aug 13;93(7):076803. doi: 10.1103/PhysRevLett.93.076803. Epub 2004 Aug 11.
We spatially resolve the infrared light emission from ambipolar carbon-nanotube field-effect transistors with long-channel lengths. Electrons and holes are injected from opposite contacts into a single nanotube molecule. The ambipolar domain, where electron and hole currents overlap, forms a microscopic light emitter within the carbon nanotube. We can control its location by varying gate and drain voltages. At high electric fields, additional stationary spots appear due to defect-assisted Zener tunneling or impact ionization. The laterally resolved measurement provides valuable insight into the transistor behavior, complementary to electronic device characteristics.
我们在空间上解析了具有长沟道长度的双极型碳纳米管场效应晶体管发出的红外光。电子和空穴从相对的接触端注入到单个纳米管分子中。电子和空穴电流重叠的双极区域在碳纳米管内形成一个微观发光体。我们可以通过改变栅极和漏极电压来控制其位置。在高电场下,由于缺陷辅助的齐纳隧穿或碰撞电离会出现额外的固定光斑。横向分辨测量为晶体管行为提供了有价值的见解,这与电子器件特性互为补充。