来自定制多孔硅表面的亲和质谱分析。
Affinity mass spectrometry from a tailored porous silicon surface.
作者信息
Meng Jun-Cai, Siuzdak Gary, Finn M G
机构信息
Department of Chemistry, The Scripps Research Institute, 10550 N. Torrey Pines Rd., La Jolla, CA 92037, USA.
出版信息
Chem Commun (Camb). 2004 Sep 21(18):2108-9. doi: 10.1039/b408200a. Epub 2004 Aug 5.
DOI:10.1039/b408200a
PMID:15367998
Abstract
The development of chemically stable porous silicon (pSi) materials for DIOS (Desorption/Ionization on Silicon) mass spectrometry, covalent linkers cleaved in the DIOS laser pulse, and efficient methods for bond formation to immobilized species, allows for on-chip affinity purification and mass detection.
摘要
用于DIOS（硅片解吸/电离）质谱分析的化学稳定多孔硅（pSi）材料的开发、在DIOS激光脉冲中裂解的共价连接体以及与固定化物质形成键的有效方法，使得芯片上的亲和纯化和质量检测成为可能。
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