Bisquert Juan, Zaban Arie, Greenshtein Miri, Mora-Seró Iván
Departament de Ciències Experimentals, Universitat Jaume I, E-12080 Castelló, Spain.
J Am Chem Soc. 2004 Oct 20;126(41):13550-9. doi: 10.1021/ja047311k.
A combination of electron lifetime measurement in nanoparticles as a function of the Fermi level position at high resolution in the potential scale with a new model to describe this dependence provides a powerful tool to study the microscopic processes and parameters governing recombination in dye-sensitized solar cells. This model predicts a behavior divided in three domains for the electron lifetime dependence on open-circuit voltage that is in excellent agreement with the experimental results: a constant lifetime at high photovoltage, related to free electrons; an exponential increase due to internal trapping and detrapping and an inverted parabolla at low photovoltage that corresponds to the density of levels of acceptor electrolyte species, including the Marcus inverted region.
在纳米颗粒中进行电子寿命测量,该测量作为势标中费米能级位置的函数且具有高分辨率,并结合一个新模型来描述这种依赖性,这为研究染料敏化太阳能电池中复合过程的微观过程和参数提供了一个强大工具。该模型预测,电子寿命对开路电压的依赖性可分为三个区域,这与实验结果高度吻合:在高光电压下寿命恒定,这与自由电子有关;由于内部俘获和去俘获导致指数增加;在低光电压下呈倒抛物线,这对应于受体电解质物种的能级密度,包括马库斯反转区。