Lichtensteiger Céline, Triscone Jean-Marc, Junquera Javier, Ghosez Philippe
DPMC, Université de Genéve, 24 Quai Ernest-Ansermet, CH-1211 Genéve 4, Switzerland.
Phys Rev Lett. 2005 Feb 4;94(4):047603. doi: 10.1103/PhysRevLett.94.047603. Epub 2005 Feb 3.
The evolution of tetragonality with thickness has been probed in epitaxial c-axis oriented PbTiO3 films with thicknesses ranging from 500 down to 24 A. High resolution x ray pointed out a systematic decrease of the c-axis lattice parameter with decreasing film thickness below 200 A. Using a first-principles model Hamiltonian approach, the decrease in tetragonality is related to a reduction of the polarization attributed to the presence of a residual unscreened depolarizing field. It is shown that films below 50 A display a significantly reduced polarization but still remain ferroelectric.
在厚度范围从500埃到低至24埃的外延c轴取向的钛酸铅(PbTiO₃)薄膜中,研究了四方性随厚度的演变。高分辨率X射线表明,当薄膜厚度低于200埃时,c轴晶格参数会随着薄膜厚度的减小而系统性降低。使用第一性原理模型哈密顿方法,四方性的降低与由于残余未屏蔽去极化场的存在而导致的极化减小有关。结果表明,厚度低于50埃的薄膜显示出显著降低的极化,但仍保持铁电性。