Galperin Michael, Ratner Mark A, Nitzan Abraham
Department of Chemistry and Nanotechnology Center, Northwestern University, Evanston, Illinois 60208, USA.
Nano Lett. 2005 Jan;5(1):125-30. doi: 10.1021/nl048216c.
Within a simple mean-field model (self-consistent Hartree approximation) we discuss the possibility of polaron formation on a molecular wire as a mechanism for negative differential resistance (NDR), switching, and/or hysteresis in the I-V characteristic of molecular junctions. This mechanism differs from earlier proposed mechanisms of charging and conformational change. The polaron model captures the essential physics and provides qualitative correspondence with experimental data. The importance of active redox centers in the molecule is indicated.
在一个简单的平均场模型(自洽哈特里近似)中,我们讨论了分子线上极化子形成作为分子结I-V特性中负微分电阻(NDR)、开关和/或滞后现象机制的可能性。这种机制不同于早期提出的充电和构象变化机制。极化子模型抓住了基本物理原理,并与实验数据有定性的对应关系。文中指出了分子中活性氧化还原中心的重要性。