van Dijk Meindert A, Lippitz Markus, Orrit Michel
MoNOS, Huygens Laboratory, Universiteit Leiden, P.O. Box 9504, 2300 RA Leiden, The Netherlands.
Acc Chem Res. 2005 Jul;38(7):594-601. doi: 10.1021/ar0401303.
Individual noble-metal particles, with sizes ranging from a few tenths to some hundreds of nanometers, can now be detected by far-field optics. Single-particle microscopy gives access to inhomogeneity, distributions, and fluctuations, which were previously hidden in ensemble experiments. Scattering methods rely on dark-field illumination, spectral signatures of the metal particles, or both. More advanced techniques provide high sensitivity and improved selectivity with respect to other scatterers by isolating metal-specific signals, for example the refractive index change due to heating of the environment by a pump beam or the time-resolved optical response of the particle to a short pump pulse. We review and compare linear and nonlinear methods in far-field optical microscopy that have reached the single-particle regime by means of scattered light, thermal effects, photoluminescence, or nonlinear frequency generation.
现在,通过远场光学技术可以检测到尺寸从十分之几纳米到几百纳米不等的单个贵金属颗粒。单颗粒显微镜能够揭示以前在总体实验中隐藏的不均匀性、分布和涨落情况。散射方法依赖于暗场照明、金属颗粒的光谱特征或两者兼而有之。更先进的技术通过分离金属特定信号,例如泵浦光束加热环境导致的折射率变化或颗粒对短泵浦脉冲的时间分辨光学响应,相对于其他散射体提供了高灵敏度和更高的选择性。我们回顾并比较了远场光学显微镜中的线性和非线性方法,这些方法通过散射光、热效应、光致发光或非线性频率产生达到了单颗粒状态。