Biran Roy, Martin David C, Tresco Patrick A
The Keck Center for Tissue Engineering, Department of Bioengineering, University of Utah, 20S 2030E Bldg. 570 Rm. 108, Salt Lake City, UT 84112, USA.
Exp Neurol. 2005 Sep;195(1):115-26. doi: 10.1016/j.expneurol.2005.04.020.
Implantable silicon microelectrode array technology is a useful technique for obtaining high-density, high-spatial resolution sampling of neuronal activity within the brain and holds promise for a wide range of neuroprosthetic applications. One of the limitations of the current technology is inconsistent performance in long-term applications. Although the brain tissue response is believed to be a major cause of performance degradation, the precise mechanisms that lead to failure of recordings are unknown. We observed persistent ED1 immunoreactivity around implanted silicon microelectrode arrays implanted in adult rat cortex that was accompanied by a significant reduction in nerve fiber density and nerve cell bodies in the tissue immediately surrounding the implanted silicon microelectrode arrays. Persistent ED1 up-regulation and neuronal loss was not observed in microelectrode stab controls indicating that the phenotype did not result from the initial mechanical trauma of electrode implantation, but was associated with the foreign body response. In addition, we found that explanted electrodes were covered with ED1/MAC-1 immunoreactive cells and that the cells released MCP-1 and TNF-alpha under serum-free conditions in vitro. Our findings suggest a potential new mechanism for chronic recording failure that involves neuronal cell loss, which we speculate is caused by chronic inflammation at the microelectrode brain tissue interface.
可植入式硅微电极阵列技术是一种用于在脑内获取神经元活动的高密度、高空间分辨率采样的有用技术,并且在广泛的神经假体应用中具有前景。当前技术的局限性之一是长期应用中的性能不一致。尽管脑组织反应被认为是性能下降的主要原因,但导致记录失败的精确机制尚不清楚。我们观察到植入成年大鼠皮层的硅微电极阵列周围存在持续的ED1免疫反应性,同时在植入的硅微电极阵列周围紧邻组织中的神经纤维密度和神经细胞体显著减少。在微电极穿刺对照中未观察到持续的ED1上调和神经元丢失,这表明该表型不是由电极植入的初始机械创伤引起的,而是与异物反应相关。此外,我们发现取出的电极被ED1/MAC-1免疫反应性细胞覆盖,并且这些细胞在无血清体外条件下释放MCP-1和TNF-α。我们的研究结果提示了一种涉及神经元细胞丢失的慢性记录失败的潜在新机制,我们推测这是由微电极与脑组织界面处的慢性炎症引起的。