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飞秒激光微结构化硅光电二极管的可见和近红外响应度

Visible and near-infrared responsivity of femtosecond-laser microstructured silicon photodiodes.

作者信息

Carey James E, Crouch Catherine H, Shen Mengyan, Mazur Eric

机构信息

Division of Engineering and Applied Sciences and Department of Physics, Harvard University, 9 Oxford Street, Cambridge, Massachusetts 02138, USA.

出版信息

Opt Lett. 2005 Jul 15;30(14):1773-5. doi: 10.1364/ol.30.001773.

Abstract

We investigated the current-voltage characteristics and responsivity of photodiodes fabricated with silicon that was microstructured by use of femtosecond-laser pulses in a sulfur-containing atmosphere. The photodiodes that we fabricated have a broad spectral response ranging from the visible to the near infrared (400-1600 nm). The responsivity depends on substrate doping, microstructuring fluence, and annealing temperature. We obtained room-temperature responsivities as high as 100 A/W at 1064 nm, 2 orders of magnitude higher than for standard silicon photodiodes. For wavelengths below the bandgap we obtained responsivities as high as 50 mA/W at 1330 nm and 35 mA/W at 1550 nm.

摘要

我们研究了在含硫气氛中使用飞秒激光脉冲进行微结构化处理的硅基光电二极管的电流-电压特性和响应度。我们制造的光电二极管具有从可见光到近红外(400 - 1600 nm)的宽光谱响应。响应度取决于衬底掺杂、微结构化处理的能量密度和退火温度。我们在1064 nm处获得了高达100 A/W的室温响应度,比标准硅光电二极管高两个数量级。对于低于带隙的波长,我们在1330 nm处获得了高达50 mA/W的响应度,在1550 nm处获得了35 mA/W的响应度。

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