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用于有序合金倾斜系列的暗场透射电子显微镜:迈向电子断层扫描。

Dark-field transmission electron microscopy for a tilt series of ordering alloys: toward electron tomography.

作者信息

Kimura Kousuke, Hata Satoshi, Matsumura Syo, Horiuchi Takao

出版信息

J Electron Microsc (Tokyo). 2005 Aug;54(4):373-7. doi: 10.1093/jmicro/dfi060. Epub 2005 Sep 5.

Abstract

Here we show a technique to obtain a tilt series of dark-field (DF) transmission electron microscopy (TEM) images in ordering alloys for tomographic three-dimensional (3D) observations. A tilt series of DF TEM images of D1a-ordered Ni4Mo precipitates in a Ni-Mo alloy was successfully obtained by adjusting a diffraction condition for a superlattice reflection from the Ni4Mo precipitates. Since the superlattice reflection usually has a long extinction distance, dynamic diffraction effects such as thickness fringes can be suppressed to some extent with precise realignment of the diffraction condition. By using the tilt series of the DF TEM images, we attempted a computed TEM tomography to visualize 3D shapes and positions of the precipitates.

摘要

在此,我们展示了一种在有序合金中获取暗场(DF)透射电子显微镜(TEM)图像倾斜系列的技术,用于断层三维(3D)观察。通过调整来自Ni4Mo析出相的超晶格反射的衍射条件,成功获得了Ni-Mo合金中D1a有序Ni4Mo析出相的DF TEM图像倾斜系列。由于超晶格反射通常具有较长的消光距离,通过精确重新调整衍射条件,可以在一定程度上抑制诸如厚度条纹等动态衍射效应。利用DF TEM图像的倾斜系列,我们尝试进行计算TEM断层扫描,以可视化析出相的3D形状和位置。

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