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氢键强度的变化解释了10种铁氧化还原蛋白变体的还原电位。

Changes in hydrogen-bond strengths explain reduction potentials in 10 rubredoxin variants.

作者信息

Lin I-Jin, Gebel Erika B, Machonkin Timothy E, Westler William M, Markley John L

机构信息

Graduate Program in Biophysics, National Magnetic Resonance Facility at Madison, University of Wisconsin, 433 Babcock Drive, Madison, WI 53706, USA.

出版信息

Proc Natl Acad Sci U S A. 2005 Oct 11;102(41):14581-6. doi: 10.1073/pnas.0505521102. Epub 2005 Sep 30.

Abstract

The rubredoxin from Clostridium pasteurianum (CpRd) provides an excellent system for investigating how the protein sequence modulates the reduction potential of the active site in an iron-sulfur protein. (15)N NMR spectroscopy has allowed us to determine with unprecedented accuracy the strengths of all six key hydrogen bonds between protein backbone amides and the sulfur atoms of the four cysteine residues that ligate the iron in the oxidized (Fe(III)) and reduced (Fe(II)) forms of wild-type CpRd and nine mutants (V44G, V44A, V44I, V44L, V8G, V8A, V8I, V8L, and V8G/V44G). The length (or strength) of each hydrogen bond was inferred from the magnitude of electron spin delocalized across the hydrogen bond from the iron atom onto the nitrogen. The aggregate lengths of these six hydrogen bonds are shorter in both oxidation states in variants with higher reduction potential than in those with lower reduction potential. Differences in aggregate hydrogen bonding upon reduction correlate linearly with the published reduction potentials for the 10 CpRd variants, which span 126 mV. Sequence effects on the reduction potential can be explained fully by their influence on hydrogen-bond strengths.

摘要

来自巴氏梭菌的红素氧还蛋白(CpRd)为研究蛋白质序列如何调节铁硫蛋白活性位点的还原电位提供了一个出色的系统。(15)N核磁共振光谱使我们能够以前所未有的准确度确定蛋白质主链酰胺与四个半胱氨酸残基的硫原子之间所有六个关键氢键的强度,这四个半胱氨酸残基在野生型CpRd及其九个突变体(V44G、V44A、V44I、V44L、V8G、V8A、V8I、V8L和V8G/V44G)的氧化态(Fe(III))和还原态(Fe(II))中与铁配位。每个氢键的长度(或强度)是根据从铁原子到氮原子跨越氢键离域的电子自旋大小推断出来的。在还原电位较高的变体中,这六个氢键的总长度在两种氧化态下都比还原电位较低的变体中的短。还原时总氢键的差异与已发表的10种CpRd变体的还原电位呈线性相关,这些变体的还原电位跨度为126 mV。序列对还原电位的影响可以完全通过它们对氢键强度的影响来解释。

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