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粉末X射线衍射在研究原料药粉末压实行为中的应用。

Application of powder X-ray diffraction in studying the compaction behavior of bulk pharmaceutical powders.

作者信息

Bandyopadhyay Rebanta, Selbo Jon, Amidon Gregory E, Hawley Michael

机构信息

Michigan Pharmaceutical Sciences, Pfizer Global Research and Development, Pfizer, Inc., Kalamazoo, Michigan 49001, USA.

出版信息

J Pharm Sci. 2005 Nov;94(11):2520-30. doi: 10.1002/jps.20415.

Abstract

This study investigates the effects of crystal lattice deformation on the powder X-ray diffraction (PXRD) patterns of compressed polycrystalline specimen (compacts/tablets) made from molecular, crystalline powders. The displacement of molecules and the corresponding adjustment of interplanar distances (d-spacings) between diffracting planes of PNU-288034 and PNU-177553, which have crystal habits with a high aspect ratio favoring preferred orientation during tableting, are demonstrated by shifts in the diffracted peak positions. The direction of shift in diffracted peak positions suggests a reduction of interplanar d-spacing in the crystals of PNU-288034 and PNU-177553 following compaction. There is also a general reduction of peak intensities following compression at the different compressive loads. The lattice strain representing the reduction in d-spacing is proportional to the original d-spacing of the uncompressed sample suggesting that, as with systems that obey a simple Hooke's law relationship, the further apart the planes of atoms/molecules within the lattice are, the easier it is for them to approach each other under compressive stresses. For a third model compound comprising more equant-shaped crystals of PNU-141659, the shift in diffracted peak positions are consistent with an expansion of lattice spacing after compression. This apparent anomaly is supported by the PXRD studies of the bulk powder consisting of fractured crystals where also, the shift in peak position suggests expansion of the lattice planes. Thus the crystals of PNU-141659 may be fracturing under the compressive loads used to produce the compacts. Additional studies are underway to relate the PXRD observations with the bulk tableting properties of these model compounds.

摘要

本研究调查了晶格变形对由分子晶体粉末制成的压缩多晶试样(压片/片剂)的粉末X射线衍射(PXRD)图谱的影响。通过衍射峰位置的移动,证明了具有高纵横比晶体习性且在压片过程中有利于择优取向的PNU - 288034和PNU - 177553的衍射平面之间分子的位移以及平面间距(d间距)的相应调整。衍射峰位置的移动方向表明,压实后PNU - 288034和PNU - 177553晶体中的平面d间距减小。在不同压缩载荷下压缩后,峰强度也普遍降低。表示d间距减小的晶格应变与未压缩样品的原始d间距成正比,这表明,与遵循简单胡克定律关系的系统一样,晶格内原子/分子平面相距越远,在压缩应力下它们彼此靠近就越容易。对于包含更多等轴状PNU - 141659晶体的第三种模型化合物,衍射峰位置的移动与压缩后晶格间距的扩大一致。由破碎晶体组成的散装粉末的PXRD研究支持了这一明显的异常现象,其中峰位置的移动也表明晶格平面的扩大。因此,PNU - 141659的晶体可能在用于制备压片的压缩载荷下发生破碎。正在进行额外的研究,以将PXRD观察结果与这些模型化合物的整体压片性质联系起来。

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