Palo Kaupo, Mets Ulo, Loorits Vello, Kask Peet
Evotec Technologies, Harku, Estonia.
Biophys J. 2006 Mar 15;90(6):2179-91. doi: 10.1529/biophysj.105.066084. Epub 2005 Dec 30.
Fitting of photon-count number histograms is a way of analysis of fluorescence intensity fluctuations, a successor to fluorescence correlation spectroscopy. First versions of the theory for calculating photon-count number distributions have assumed constant emission intensity by a molecule during a counting time interval. For a long time a question has remained unanswered: to what extent is this assumption violated in experiments? Here we present a theory of photon-count number distributions that takes account of intensity fluctuations during a counting time interval. Theoretical count-number distributions are calculated via a numerical solution of Master equations (ME), which is a set of differential equations describing diffusion, singlet-triplet transitions, and photon emission. Detector afterpulsing and dead-time corrections are also included. The ME-theory is tested by fitting a series of photon-count number histograms corresponding to different lengths of the counting time interval. Compared to the first version of fluorescence intensity multiple distribution analysis theory introduced in 2000, the fit quality is significantly improved. It is discussed how a theory of photon-count number distributions, which assumes constant emission intensity during a counting time interval, may also yield a good fit quality. We argue that the spatial brightness distribution used in calculations of the fit curve is not the true spatial brightness distribution. Instead, a number of dynamic processes, which cause fluorescence intensity fluctuations, are indirectly taken into account via the profile adjustment parameters.
光子计数直方图拟合是一种分析荧光强度波动的方法,是荧光相关光谱学的后续方法。计算光子计数分布的理论的最初版本假设分子在计数时间间隔内发射强度恒定。长期以来,一个问题一直没有得到解答:在实验中这个假设在多大程度上被违反了?在这里,我们提出了一种考虑计数时间间隔内强度波动的光子计数分布理论。理论计数分布通过主方程(ME)的数值解来计算,主方程是一组描述扩散、单重态-三重态跃迁和光子发射的微分方程。还包括探测器后脉冲和死时间校正。通过拟合一系列对应于不同计数时间间隔长度的光子计数直方图来检验ME理论。与2000年引入的荧光强度多重分布分析理论的第一版相比,拟合质量有了显著提高。讨论了一种在计数时间间隔内假设发射强度恒定的光子计数分布理论如何也能产生良好的拟合质量。我们认为,用于拟合曲线计算的空间亮度分布不是真实的空间亮度分布。相反,通过轮廓调整参数间接考虑了许多导致荧光强度波动的动态过程。