Koch C T, Garofalini S H
Max Planck Institute for Metals Research, Heisenbergstr. 3, D-70569 Stuttgart, Germany.
Ultramicroscopy. 2006 Mar;106(4-5):383-8. doi: 10.1016/j.ultramic.2005.11.005. Epub 2005 Dec 21.
We report on an alternative method to electron nanodiffraction and fluctuation microscopy for the determination of the reduced density function G(r) of amorphous areas with small cross-sections. This method is based on the numerical extraction of diffraction data from the complex-valued exit-face wave function as obtained by HRTEM focal series reconstruction or electron holography. Since it is thus possible to obtain "diffraction data" from rectangular areas of any aspect ratio, this method is particularly suited for intergranular glassy films of only 1-2 nm width, but lengths of several 100 nm. A critical comparison of this method with the already established nanodiffraction and fluctuation microscopy will be made.
我们报告了一种替代电子纳米衍射和涨落显微镜的方法，用于测定具有小横截面的非晶区域的约化密度函数G(r)。该方法基于从通过高分辨透射电子显微镜（HRTEM）焦系列重建或电子全息术获得的复值出射面波函数中数值提取衍射数据。由于能够从任何纵横比的矩形区域获得“衍射数据”，因此该方法特别适用于宽度仅为1 - 2纳米、长度为几百纳米的晶间玻璃质薄膜。将对该方法与已确立的纳米衍射和涨落显微镜进行关键比较。
