Nam Chang-Yong, Jaroenapibal Papot, Tham Douglas, Luzzi David E, Evoy Stephane, Fischer John E
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia, Pennsylvania 19104-6272, USA.
Nano Lett. 2006 Feb;6(2):153-8. doi: 10.1021/nl051860m.
The diameter-dependent Young's modulus, E, and quality factor, Q, of GaN nanowires were measured using electromechanical resonance analysis in a transmission electron microscope. E is close to the theoretical bulk value ( approximately 300 GPa) for a large diameter nanowire (d=84 nm) but is significantly smaller for smaller diameters. At room temperature, Q is as high as 2,800 for d=84 nm, significantly greater than what is obtained from micromachined Si resonators of comparable surface-to-volume ratio. This implies significant advantages of smooth-surfaced GaN nanowire resonators for nanoelectromechanical system (NEMS) applications. Two closely spaced resonances are observed and attributed to the low-symmetry triangular cross section of the nanowires.
利用透射电子显微镜中的机电共振分析,测量了氮化镓纳米线的直径相关杨氏模量E和品质因数Q。对于大直径纳米线(d = 84 nm),E接近理论体值(约300 GPa),但对于较小直径的纳米线,E则显著更小。在室温下,对于d = 84 nm的纳米线,Q高达2800,明显大于具有可比表面体积比的微机械加工硅谐振器所获得的值。这意味着表面光滑的氮化镓纳米线谐振器在纳米机电系统(NEMS)应用中具有显著优势。观察到两个紧密间隔的共振,并归因于纳米线的低对称三角形横截面。