Bhattacharyya Somnath, Koch Christoph T, Rühle Manfred
Max-Planck-Institut für Metallforschung, HeisenbergStrasse 3, Stuttgart-70569, Germany.
Ultramicroscopy. 2006 Apr;106(6):525-38. doi: 10.1016/j.ultramic.2006.01.007. Epub 2006 Feb 21.
An iterative method for reconstructing the exit face wave function from a through focal series of transmission electron microscopy image line profiles across an interface is presented. Apart from high-resolution images recorded with small changes in defocus, this method works also well for a large defocus range as used for Fresnel imaging. Using the phase-object approximation the projected electrostatic as well as the absorptive potential profiles across an interface are determined from this exit face wave function. A new experimental image alignment procedure was developed in order to align images with large relative defocus shift. The performance of this procedure is shown to be superior to other image alignment procedures existing in the literature. The reconstruction method is applied to both simulated and experimental images.
提出了一种从穿过界面的透射电子显微镜图像线轮廓的焦深系列重建出射面波函数的迭代方法。除了在散焦变化较小的情况下记录的高分辨率图像外，该方法对于用于菲涅耳成像的大散焦范围也同样适用。利用相位物体近似，从该出射面波函数确定穿过界面的投影静电势和吸收势轮廓。为了对齐具有大相对散焦偏移的图像，开发了一种新的实验图像对齐程序。结果表明，该程序的性能优于文献中现有的其他图像对齐程序。该重建方法应用于模拟图像和实验图像。
