Oh Y J, Lee J H, Jo W
Department of Physics and Division of Nanosciences, Ewha Womans University, Seoul 120 750, Republic of Korea.
Ultramicroscopy. 2006 Jun-Jul;106(8-9):779-84. doi: 10.1016/j.ultramic.2005.12.015. Epub 2006 Apr 18.
Retention behavior and local hysteresis characteristics in Pb(Zr(0.52)Ti(0.48))O(3) (PZT) thin films on Pt electrodes have been investigated by electrostatic force microscopy (EFM). A sol-gel method is used to synthesize PZT thin films and drying conditions are carefully explored over a wide range of temperature. Decay and retention mechanisms of single-poled and reverse-poled regions of the ferroelectric thin films are explained by space charge redistribution. Trapping behavior of space charges is dependent on the nature of interface between ferroelectric thin films and bottom electrodes. Local measurement of polarization-electric field curves by EFM shows inhomogeneous space charge entrapment.
通过静电力显微镜（EFM）研究了Pt电极上Pb(Zr(0.52)Ti(0.48))O(3)（PZT）薄膜的保留行为和局部滞后特性。采用溶胶-凝胶法合成PZT薄膜，并在很宽的温度范围内仔细研究干燥条件。铁电薄膜单极化和反极化区域的衰减和保留机制通过空间电荷重新分布来解释。空间电荷的俘获行为取决于铁电薄膜与底部电极之间界面的性质。通过EFM对极化-电场曲线进行局部测量，结果表明存在不均匀的空间电荷俘获现象。
