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[用小型X射线衍射仪测量粉尘中游离二氧化硅浓度]

[Measurement of free silica concentration in the dust by small X-ray diffractometer].

作者信息

Liu X W

机构信息

Liaoning Provincial Institute of Occupational Health, Shenyang.

出版信息

Zhonghua Yu Fang Yi Xue Za Zhi. 1991 Nov;25(6):351-2.

PMID:1667863
Abstract

X-ray diffraction method was applied to measure free silica concentration in the dust and the procedure of analysis have been established. The filter used was the polyvinyl chloride filter. Good linear relationship was shown to exist between the amount of silica and the intensity of its diffracted rays (r = 0.99). The standard deviation of repeated tests was 3.199%. The coefficient of variation was 4.43. An amount of 0.015 mg silica collected on the filter (d = 9 mm) can be detected. This method is suitable for monitoring and investigating silica contents in labour hygiene studies.

摘要

采用X射线衍射法测定粉尘中游离二氧化硅浓度,并建立了分析程序。使用的滤膜是聚氯乙烯滤膜。二氧化硅含量与其衍射线强度之间呈现出良好的线性关系(r = 0.99)。重复测试的标准偏差为3.199%。变异系数为4.43。能够检测到收集在滤膜(直径9毫米)上0.015毫克的二氧化硅。该方法适用于劳动卫生研究中二氧化硅含量的监测和调查。

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