Musson Stephen E, Vann Kevin N, Jang Yong-Chul, Mutha Sarvesh, Jordan Aaron, Pearson Brian, Townsend Timothy G
Department of Environmental Engineering Sciences, University of Florida, Gainesville, Florida 32611-6450, USA.
Environ Sci Technol. 2006 Apr 15;40(8):2721-6. doi: 10.1021/es051557n.
The potential for discarded electronic devices to be classified as toxicity characteristic (TC) hazardous waste under provisions of the Resource Conservation and Recovery Act (RCRA) using the toxicity characteristic leaching procedure (TCLP) was examined. The regulatory TCLP method and two modified TCLP methods (in which devices were disassembled and leached in or near entirety) were utilized. Lead was the only element found to leach at concentrations greater than its TC limit (5 mg/L). Thirteen different types of electronic devices were tested using either the standard TCLP or modified versions. Every device type leached lead above 5 mg/L in at least one test and most devices leached lead above the TC limit in a majority of cases. Smaller devices that contained larger amounts of plastic and smaller amounts of ferrous metal (e.g., cellular phones, remote controls) tended to leach lead above the TC limit at a greater frequency than devices with more ferrous metal (e.g., computer CPUs, printers).
研究了废弃电子设备根据《资源保护与回收法》(RCRA)的规定,使用毒性特征浸出程序(TCLP)被归类为毒性特征(TC)危险废物的可能性。采用了监管的TCLP方法和两种改进的TCLP方法(将设备拆解并几乎全部进行浸出)。发现只有铅以高于其TC限值(5毫克/升)的浓度浸出。使用标准TCLP或改进版本对13种不同类型的电子设备进行了测试。每种设备类型在至少一次测试中浸出的铅都高于5毫克/升,并且在大多数情况下,大多数设备浸出的铅高于TC限值。与含有较多黑色金属的设备(如计算机CPU、打印机)相比,含有大量塑料和少量黑色金属的较小设备(如手机、遥控器)往往更频繁地浸出高于TC限值的铅。