Kawasaki K, Iwasaki H
J Synchrotron Radiat. 1995 Jan 1;2(Pt 1):49-55. doi: 10.1107/S0909049594011374.
Taking advantage of the high brilliance of synchrotron radiation, a system was developed for rapid mapping of the orientation distribution of crystal grains (texture) in polycrystalline materials using an imaging plate. A monochromatized beam is incident on the sample, which is rotated using the omega-axis mechanism of an X-ray diffractometer so that the surface of the sphere of poles of the selected reflection is scanned by the Ewald sphere. Simultaneously, the imaging plate is translated vertically with a velocity that is synchronized with that of the sample rotation. It is possible to record pole figures over an extended angular range within a short period of time, typically of the order of minutes. The method has been applied to the observation of a time change in the orientation distribution of metal sheets at elevated temperatures.
利用同步辐射的高亮度，开发了一种系统，该系统使用成像板快速绘制多晶材料中晶粒取向分布（织构）。单色光束入射到样品上，样品通过X射线衍射仪的ω轴机构旋转，以便埃瓦尔德球扫描所选反射的极球表面。同时，成像板以与样品旋转速度同步的速度垂直平移。可以在短时间内（通常为几分钟量级）在扩展的角度范围内记录极图。该方法已应用于观察金属板材在高温下取向分布随时间的变化。
