用于高通量分析成分分布薄膜的高能X射线衍射/X射线荧光光谱法。
High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films.
作者信息
Gregoire John M, Dale Darren, Kazimirov Alexander, DiSalvo Francis J, van Dover R Bruce
机构信息
Department of Physics, and Cornell Fuel Cell Institute, Cornell University, Ithaca, New York 14853, USA.
出版信息
Rev Sci Instrum. 2009 Dec;80(12):123905. doi: 10.1063/1.3274179.
High-throughput crystallography is an important tool in materials research, particularly for the rapid assessment of structure-property relationships. We present a technique for simultaneous acquisition of diffraction images and fluorescence spectra on a continuous composition spread thin film using a 60 keV x-ray source. Subsequent noninteractive data processing provides maps of the diffraction profiles, thin film fiber texture, and composition. Even for highly textured films, our diffraction technique provides detection of diffraction from each family of Bragg reflections, which affords direct comparison of the measured profiles with powder patterns of known phases. These techniques are important for high throughput combinatorial studies as they provide structure and composition maps which may be correlated with performance trends within an inorganic library.
高通量晶体学是材料研究中的一项重要工具，尤其适用于快速评估结构与性能的关系。我们提出了一种使用60 keV X射线源在连续成分分布的薄膜上同时采集衍射图像和荧光光谱的技术。随后的非交互式数据处理可提供衍射图谱、薄膜纤维织构和成分的图谱。即使对于织构很强的薄膜，我们的衍射技术也能检测到每个布拉格反射族的衍射，从而可以将测量的图谱与已知相的粉末图谱进行直接比较。这些技术对于高通量组合研究很重要，因为它们提供了结构和成分图谱，这些图谱可以与无机库中的性能趋势相关联。
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