Henkin Yael, Kaplan-Neeman Ricky, Kronenberg Jona, Migirov Lela, Hildesheimer Minka, Muchnik Chava
Department of Communication Disorders, Sackler Faculty of Medicine, Tel Aviv University, Israel.
Acta Otolaryngol. 2006 Jun;126(6):581-6. doi: 10.1080/00016480500443391.
Electrical stimulation levels and electrode impedance values (EIVs) in children using the Clarion cochlear implant (CI) programmed with CIS strategy stabilized after 3 months of implant use. The data presented here may be useful as a general guideline for the programming of infants and young children and may further be of help for the identification of patients who fall outside the "average" range.
The purpose of the present study was to evaluate changes in electrical stimulation levels, i.e. threshold (T) levels, comfortable (M) levels, dynamic range (DR), and EIVs during the first 18 months of implant use, in children using the Clarion CI.
The maps of 18 pre-lingual children (mean age at implantation 4.2 years; range 1-8), using the Enhanced Bipolar 1.2 or Bipolar standard electrode with the S-Series speech processor programmed with CIS strategy, were examined at five time points: connection, and 3, 6, 12, and 18 months post-initial stimulation. T levels, M levels, DR and EIVs were analyzed according to four cochlear segments: apical, apical-medial, medial-basal, and basal.
During the first 3 months of implant use T levels increased to some extent, whereas M levels and DR increased significantly. From 3 months and through the entire follow-up, T and M levels as well as DR were stable. EIVs of current carrying electrodes decreased significantly from connection to the 3-month visit; thereafter a stabilization of values was evident. Electrical stimulation levels and EIVs did not differ among the cochlear segments during the entire follow-up.
使用CIS策略进行编程的Clarion人工耳蜗（CI）的儿童，其电刺激水平和电极阻抗值（EIVs）在植入使用3个月后趋于稳定。本文提供的数据可作为婴幼儿编程的一般指导原则，可能有助于识别超出“平均”范围的患者。
本研究的目的是评估使用Clarion CI的儿童在植入使用的前18个月内电刺激水平的变化，即阈值（T）水平、舒适（M）水平、动态范围（DR）和EIVs。
对18名语前儿童（植入时平均年龄4.2岁；范围1 - 8岁）的图谱进行检查，这些儿童使用增强型双极1.2或双极标准电极以及采用CIS策略编程的S系列言语处理器，在五个时间点进行检查：连接时、初次刺激后3、6、12和18个月。根据四个耳蜗节段：顶端、顶端 - 内侧、内侧 - 基底和基底，分析T水平、M水平、DR和EIVs。
在植入使用的前3个月，T水平有所升高，而M水平和DR显著增加。从3个月到整个随访期间，T和M水平以及DR保持稳定。载流电极的EIVs从连接到3个月随访时显著下降；此后值趋于稳定。在整个随访期间，耳蜗节段之间的电刺激水平和EIVs没有差异。
