Kaur Charanjit, Sivakumar Viswanathan, Ang Lin Stella, Sundaresan Alamelu
Department of Anatomy, Yong Loo Lin School of Medicine, National University of Singapore, Singapore.
J Neurochem. 2006 Aug;98(4):1200-16. doi: 10.1111/j.1471-4159.2006.03964.x. Epub 2006 Jun 19.
The present study examined factors that may be involved in the development of hypoxic periventricular white matter damage in the neonatal brain. Wistar rats (1-day old) were subjected to hypoxia and the periventricular white matter (corpus callosum) was examined for the mRNA and protein expression of hypoxia-inducible factor-1alpha (HIF-1alpha), endothelial, neuronal and inducible nitric oxide synthase (eNOS, nNOS and iNOS), vascular endothelial growth factor (VEGF) and N-methyl-D-aspartate receptor subunit 1 (NMDAR1) between 3 h and 14 days after hypoxic exposure by real-time RT-PCR, western blotting and immunohistochemistry. Up-regulated mRNA and protein expression of HIF-1alpha, VEGF, NMDAR1, eNOS, nNOS and iNOS in corpus callosum was observed in response to hypoxia. NMDAR1 and iNOS expression was found in the activated microglial cells, whereas VEGF was localized to astrocytes. An enzyme immunoassay showed that the VEGF concentration in corpus callosum was significantly higher up to 7 days after hypoxic exposure. NO levels, measured by colorimetric assay, were also significantly higher in hypoxic rats up to 14 days after hypoxic exposure as compared with the controls. A large number of axons undergoing degeneration were observed between 3 h and 7 days after the hypoxic exposure at electron-microscopic level. Our findings point towards the involvement of excitotoxicity, VEGF and NO in periventricular white matter damage in response to hypoxia.
本研究检测了可能与新生儿脑缺氧性脑室周围白质损伤发生发展相关的因素。将1日龄的Wistar大鼠置于缺氧环境中,通过实时逆转录聚合酶链反应(RT-PCR)、蛋白质印迹法和免疫组织化学,检测缺氧暴露后3小时至14天期间脑室周围白质(胼胝体)中缺氧诱导因子-1α(HIF-1α)、内皮型、神经元型和诱导型一氧化氮合酶(eNOS、nNOS和iNOS)、血管内皮生长因子(VEGF)以及N-甲基-D-天冬氨酸受体亚基1(NMDAR1)的mRNA和蛋白表达。结果观察到,缺氧后胼胝体中HIF-1α、VEGF、NMDAR1、eNOS、nNOS和iNOS的mRNA和蛋白表达上调。在活化的小胶质细胞中发现了NMDAR1和iNOS的表达,而VEGF定位于星形胶质细胞。酶免疫测定显示,缺氧暴露后7天内胼胝体中的VEGF浓度显著升高。与对照组相比,通过比色法测定的缺氧大鼠在缺氧暴露后14天内的NO水平也显著升高。在电子显微镜水平上观察到,缺氧暴露后3小时至7天之间有大量轴突发生退变。我们的研究结果表明,兴奋性毒性、VEGF和NO参与了缺氧引起的脑室周围白质损伤。