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金颗粒在含铜铝基底上的电沉积。

Electrodeposition of gold particles on aluminum substrates containing copper.

作者信息

Olson Tim S, Atanassov Plamen, Brevnov Dmitri A

机构信息

Department of Chemical and Nuclear Engineering, Center for Micro-Engineered Materials, The University of New Mexico, Albuquerque, New Mexico 87131, USA.

出版信息

J Phys Chem B. 2005 Jan 27;109(3):1243-50. doi: 10.1021/jp045670w.

Abstract

Electrodeposition of adhesive metal films on aluminum is traditionally preceded by the zincate process, which activates the aluminum surface. This paper presents an alternative approach for activation of aluminum by using films containing 99.5% aluminum and 0.5% copper. Aluminum/copper films are made amenable for subsequent electrodeposition by anodization followed by chemical etching of aluminum oxide. The electrodeposition of gold is monitored with electrochemical impedance spectroscopy (EIS). Analysis of EIS data suggests that electrodeposition of gold increases the interfacial capacitance from values typical for electrodes with thin oxide layers to values typical for metal electrodes. Scanning electron microscopy examination of aluminum/copper films following gold electrodeposition shows the presence of gold particles with densities of 10(5)-10(7) particles cm(-2). The relative standard deviation of mean particle diameters is approximately 25%. Evaluation of the micrographs suggests that the electrodeposition occurs by instantaneous nucleation followed by growth of three-dimensional semispherical particles. The gold particles, which are electrically connected to the conductive aluminum/copper film, support a reversible faradaic process for a soluble redox couple. The deposited gold particles are suitable for subsequent metallization of aluminum and fabrication of particle-type films with interesting catalytic, electrical, and optical properties.

摘要

传统上,在铝表面电沉积粘附性金属膜之前要进行浸锌处理,该处理可活化铝表面。本文提出了一种通过使用含99.5%铝和0.5%铜的薄膜来活化铝的替代方法。通过阳极氧化然后对氧化铝进行化学蚀刻,使铝/铜薄膜适合后续的电沉积。用电化学阻抗谱(EIS)监测金的电沉积过程。对EIS数据的分析表明,金的电沉积使界面电容从具有薄氧化层的电极的典型值增加到金属电极的典型值。对金电沉积后的铝/铜薄膜进行扫描电子显微镜检查,结果显示存在密度为10(5)-10(7)个颗粒/cm(-2)的金颗粒。平均粒径的相对标准偏差约为25%。对显微照片的评估表明,电沉积是通过瞬时成核然后三维半球形颗粒生长而发生的。与导电铝/铜薄膜电连接的金颗粒支持可溶性氧化还原对的可逆法拉第过程。沉积的金颗粒适合用于铝的后续金属化以及制备具有有趣催化、电学和光学性质的颗粒型薄膜。

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