William H M, Singh R P, Huerta-Espino J, Palacios G, Suenaga K
International Maize and Wheat Improvement Center CIMMYT, Apdo-Postal, Mexico.
Genome. 2006 Aug;49(8):977-90. doi: 10.1139/g06-052.
Leaf (brown) and stripe (yellow) rusts, caused by Puccinia triticina and Puccinia striiformis, respectively, are fungal diseases of wheat (Triticum aestivum) that cause significant yield losses annually in many wheat-growing regions of the world. The objectives of our study were to characterize genetic loci associated with resistance to leaf and stripe rusts using molecular markers in a population derived from a cross between the rust-susceptible cultivar 'Avocet S' and the resistant cultivar 'Pavon76'. Using bulked segregant analysis and partial linkage mapping with AFLPs, SSRs and RFLPs, we identified 6 independent loci that contributed to slow rusting or adult plant resistance (APR) to the 2 rust diseases. Using marker information available from existing linkage maps, we have identified additional markers associated with resistance to these 2 diseases and established several linkage groups in the 'Avocet S' x 'Pavon76' population. The putative loci identified on chromosomes 1BL, 4BL, and 6AL influenced resistance to both stripe and leaf rust. The loci on chromosomes 3BS and 6BL had significant effects only on stripe rust, whereas another locus, characterized by AFLP markers, had minor effects on leaf rust only. Data derived from Interval mapping indicated that the loci identified explained 53% of the total phenotypic variation (R2) for stripe rust and 57% for leaf rust averaged across 3 sets of field data. A single chromosome recombinant line population segregating for chromosome 1B was used to map Lr46/Yr29 as a single Mendelian locus. Characterization of slow-rusting genes for leaf and stripe rust in improved wheat germplasm would enable wheat breeders to combine these additional loci with known slow-rusting loci to generate wheat cultivars with higher levels of slow-rusting resistance.
叶锈病(褐色)和条锈病(黄色)分别由小麦叶锈菌(Puccinia triticina)和条形柄锈菌(Puccinia striiformis)引起,是小麦(Triticum aestivum)的真菌病害,在世界许多小麦种植区每年都会造成重大产量损失。我们研究的目的是利用分子标记在感病品种‘Avocet S’和抗病品种‘Pavon76’杂交产生的群体中,鉴定与叶锈病和条锈病抗性相关的基因位点。通过混合分组分析法以及利用AFLP、SSR和RFLP进行部分连锁作图,我们鉴定出6个独立的位点,这些位点有助于对这两种锈病产生慢锈性或成株抗性(APR)。利用现有连锁图谱中的标记信息,我们鉴定出了与这两种病害抗性相关的其他标记,并在‘Avocet S’בPavon76’群体中建立了几个连锁群。在1BL、4BL和6AL染色体上鉴定出的假定位点影响对条锈病和叶锈病的抗性。3BS和6BL染色体上的位点仅对条锈病有显著影响,而另一个由AFLP标记表征的位点仅对叶锈病有轻微影响。区间作图得到的数据表明,鉴定出的位点平均解释了3组田间数据中条锈病总表型变异(R2)的53%和叶锈病的57%。利用一个在1B染色体上分离的单染色体重组系群体,将Lr46/Yr29定位为一个单一的孟德尔位点。对改良小麦种质中叶锈病和条锈病慢锈基因的表征,将使小麦育种者能够将这些额外的位点与已知的慢锈位点相结合,从而培育出具有更高水平慢锈抗性的小麦品种。