Sztwiertnia K, Faryna M, Sawina G
Polish Academy of Sciences, Institute of Metallurgy and Materials Science, 25 Reymonta Street, 30-059 Krakow, Poland.
J Microsc. 2006 Oct;224(Pt 1):4-7. doi: 10.1111/j.1365-2818.2006.01636.x.
Specific crystallographic correlations between neighbouring grains in composites were established by the use of selected area electron diffraction in the transmission electron microscope. However, it was the development of orientation mapping techniques that made it possible to obtain a quantitative description of the distribution of boundaries between the grains of both the same phase and different phases. This study shows that orientation topography measurements made by electron backscatter diffraction in the scanning electron microscope allowed determination of the crystallographic relationships between grains of different phases. An alumina-based composite with a content of 10 vol% tungsten carbide was chosen for investigations. Misorientation distribution functions were calculated to describe the distribution density of misorientations with respect to the nearest neighbouring measured point located in the grain of the second phase. The analysis of misorientation distribution functions permitted the evaluation of preferences for some special crystallographic correlations between the grains of composite matrix and inclusions as well as shares of interphase boundaries characterized by those correlations.
通过在透射电子显微镜中使用选区电子衍射，建立了复合材料中相邻晶粒之间特定的晶体学相关性。然而，正是取向映射技术的发展使得获得对同相和不同相晶粒之间边界分布的定量描述成为可能。本研究表明，通过扫描电子显微镜中的电子背散射衍射进行的取向形貌测量能够确定不同相晶粒之间的晶体学关系。选择了一种碳化钨含量为10体积%的氧化铝基复合材料进行研究。计算了取向差分布函数，以描述相对于位于第二相晶粒中的最近邻测量点的取向差分布密度。对取向差分布函数的分析允许评估复合材料基体和夹杂物晶粒之间某些特殊晶体学相关性的偏好以及以这些相关性为特征的相间边界的份额。
