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用于推导粗糙表面反射模型的统计射线法。

Statistical ray method for deriving reflection models of rough surfaces.

作者信息

Sun Yinlong

机构信息

Department of Computer Sciences, Purdue University, Indiana 47907, USA.

出版信息

J Opt Soc Am A Opt Image Sci Vis. 2007 Mar;24(3):724-44. doi: 10.1364/josaa.24.000724.

Abstract

A statistical ray method is developed for deriving reflection models of rough surfaces. Using this method, we derive generic equations of reflection due to single scattering. We have studied an isotropic surface with Gaussian statistics, and the derived bidirectional reflectance distribution function is found with four distinct regimes, namely, mirror reflection, grazing reflection, retroreflection, and normal reflection. An explicit form of self-shadowing for a surface with Gaussian statistics is also derived, and the result agrees well with computer simulation. Our solution is useful to describe the entire reflection of a highly or moderately smooth surface and offers a basis for studying multiple scattering. While focusing on optical reflection, the approach also applies to other waves if the assumptions are satisfied.

摘要

开发了一种统计射线方法来推导粗糙表面的反射模型。使用该方法,我们推导了单次散射引起的反射通用方程。我们研究了具有高斯统计特性的各向同性表面,发现所推导的双向反射分布函数有四种不同的区域,即镜面反射、掠射反射、后向反射和法向反射。还推导了具有高斯统计特性表面的自阴影显式形式,结果与计算机模拟吻合良好。我们的解决方案有助于描述高度或中度光滑表面的整体反射,并为研究多次散射提供了基础。虽然专注于光反射,但如果满足假设,该方法也适用于其他波。

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