Ankerhold Joachim
Physikalisches Institut, Albert-Ludwigs-Universität, 79104 Freiburg, Germany.
Phys Rev Lett. 2007 Jan 19;98(3):036601. doi: 10.1103/PhysRevLett.98.036601. Epub 2007 Jan 16.
Motivated by several experimental activities to detect charge noise produced by a mesoscopic conductor with a Josephson junction as on-chip detector, the switching rate out of its zero-voltage state is studied. This process is related to the problem of thermal escape in presence of non-Gaussian fluctuations. In the relevant case of weak higher than second order cumulants, an effective Fokker-Planck equation is derived, which is then used to obtain an explicit expression for the escape rate. Specific results for the rate asymmetry due to the third moment of current noise allow to analyze experimental data and to optimize detection circuits.
受若干实验活动的启发，这些活动旨在检测由带有约瑟夫森结的介观导体作为片上探测器产生的电荷噪声，研究了其从零电压状态的开关速率。这个过程与存在非高斯涨落时的热逃逸问题相关。在高于二阶累积量较弱的相关情形下，推导出了一个有效的福克 - 普朗克方程，然后用它来获得逃逸率的显式表达式。由于电流噪声的三阶矩导致的速率不对称的具体结果有助于分析实验数据并优化检测电路。
