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衍射相位的高可见度干涉测量

High-visibility interferometric measurement of the diffraction phase.

作者信息

Barraza-Lopez Salvador, James Daniel F V, Kwiat Paul G

机构信息

Department of Physics and Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.

出版信息

J Opt Soc Am A Opt Image Sci Vis. 2007 Apr;24(4):1148-55. doi: 10.1364/josaa.24.001148.

Abstract

We obtain the absolute phase in Fresnel diffraction for Gaussian beams by using a modified polarization Sagnac interferometer in which counterpropagating paths are spatially separated and labeled according to polarization. By erasing the polarization "which-path" information with an analyzing polarizer situated after the modified interferometer, we are able to regain interference and to precisely control the relative intensities of the diffracted and the reference beams. The resulting optimized visibility allows for a precise phase determination. This setup is very stable, requiring no active elements.

摘要

我们通过使用一种改进的偏振萨尼亚克干涉仪来获取高斯光束菲涅耳衍射中的绝对相位,在该干涉仪中,反向传播路径在空间上分离,并根据偏振进行标记。通过使用位于改进干涉仪之后的分析偏振器消除偏振“哪条路径”信息,我们能够重新获得干涉并精确控制衍射光束和参考光束的相对强度。由此产生的优化可见度允许进行精确的相位测定。该装置非常稳定,无需有源元件。

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