Hashimoto Ken-ya, Kamizuma Hiroshi, Watanabe Masashi, Omori Tatsuya, Yamaguchi Masatsune
IEEE Trans Ultrason Ferroelectr Freq Control. 2007 May;54(5):1072-5. doi: 10.1109/tuffc.2007.353.
This paper is aimed at demonstrating how the wavenumber domain analysis of two-dimensional (2-D) images captured by phase-sensitive laser probe systems is applied in the characterization of RF SAW devices. Effectiveness is demonstrated through the selective characterization of spurious resonance modes and scattered, nonguided modes appearing in SAW resonators.
本文旨在展示通过相敏激光探针系统捕获的二维（2-D）图像的波数域分析如何应用于射频声表面波（RF SAW）器件的特性表征。通过对声表面波谐振器中出现的杂散谐振模式和散射非导模进行选择性表征，证明了该方法的有效性。
