Science. 1982 May 21;216(4548):805-12. doi: 10.1126/science.216.4548.805.
Ion beams are important new probes for characterizing the chemistry and structure of a wide variety of materials. When beams of particles with energies of approximately 1000 electron volts are used, as in secondary ion mass spectrometry, it is possible to detect ions ejected from the top layer of the material with sensitivities we below the picogram level. A number of theoretical developments now permit analysis of the geometry of adsorbed atoms and molecules on surfaces from the angular distributions of the ejected particles. Much surface chemical information can also be deduced from ejected molecular cluster ions. In addition, the observation of clusters with weights up to nearly 20,000 atomic mass units promises to expand applications of mass spectrometry to the analysis of biomolecules and the sequencing of proteins.
离子束是用于描述各种材料的化学和结构的重要新型探针。当使用大约 1000 电子伏特能量的粒子束，如在二次离子质谱中，就有可能检测到从材料顶层射出的离子，其灵敏度达到皮克以下的水平。现在，一些理论上的发展允许从射出粒子的角度分布来分析表面上吸附原子和分子的几何形状。从射出的分子团离子中也可以推导出许多表面化学信息。此外，观察到重量高达近 20,000 原子质量单位的团簇有望将质谱法的应用扩展到生物分子的分析和蛋白质的测序。
