Youravong Nattaporn, Teanpaisan Rawee, Norén Jörgen G, Robertson Agneta, Dietz Wolfram, Odelius Hans, Dahlén Gunnar
Department of Preventive Dentistry, Faculty of Dentistry, Prince of Songkla University, Songkhla, Thailand.
Sci Total Environ. 2008 Jan 25;389(2-3):253-8. doi: 10.1016/j.scitotenv.2007.08.053. Epub 2007 Oct 29.
Enamel and dentine in teeth of children with high blood levels of lead were analyzed by means of secondary ion mass spectrometry (SIMS) and X-ray micro-analyses (XRMA) and compare with teeth from children with low blood levels of lead. The SIMS analysis revealed detectable levels of Pb in dentine close to the pulp. The XRMA analyses could not detect any lead. There were no differences found in lead level in enamel of high lead level exposed teeth from low level exposed. The results confirm that children with high blood levels of lead have an uptake of lead in dentine close to the pulp.
采用二次离子质谱法(SIMS)和X射线微分析法(XRMA)对血铅水平高的儿童牙齿中的牙釉质和牙本质进行了分析,并与血铅水平低的儿童牙齿进行了比较。SIMS分析显示,靠近牙髓的牙本质中可检测到铅含量。XRMA分析未检测到任何铅。高铅暴露组牙齿的牙釉质铅含量与低铅暴露组相比没有差异。结果证实,血铅水平高的儿童牙髓附近的牙本质中会摄取铅。