Pellegrino Maurizio, Suárez-Fariñas Mayte, Magnasco Marcelo O, Wittkowski Knut M
Conf Proc IEEE Eng Med Biol Soc. 2006;2006:4100-2. doi: 10.1109/IEMBS.2006.260753.
Microscopists are familiar with many blemishes that fluorescence images can have due to dust and debris, glass flaws, uneven distribution of fluids or surface coatings, etc. Microarray scans do show similar artifacts, which might affect subsequent analysis. We developed a tool, Harshlight, for the detection and masking of blemishes in HDONA microarray chips. Harshlight uses a combination of statistic and image processing methods to identify defects. We demonstrate that Harshlight can be widely used for chips with different technologies thanks to its user-tunable parameters. Here we report its application to SNP microarrays.
显微镜学家们熟知荧光图像可能因灰尘、碎屑、玻璃瑕疵、液体或表面涂层分布不均等而出现许多瑕疵。微阵列扫描确实会显示类似的伪像，这可能会影响后续分析。我们开发了一种工具Harshlight，用于检测和掩盖HDONA微阵列芯片中的瑕疵。Harshlight结合了统计和图像处理方法来识别缺陷。我们证明，由于其用户可调参数，Harshlight可广泛用于不同技术的芯片。在此我们报告其在SNP微阵列中的应用。
