利用轻敲模式原子力显微镜中的分岔现象校准随时间变化的针尖-样品力测量。

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.

作者信息

Sahin Ozgur

机构信息

The Rowland Institute at Harvard, Harvard University, Cambridge, Massachusetts 02142, USA.

出版信息

Rev Sci Instrum. 2007 Oct;78(10):103707. doi: 10.1063/1.2801009.

DOI:10.1063/1.2801009

PMID:17979428

Abstract

Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.

摘要

扭转谐波悬臂梁可在轻敲模式原子力显微镜中测量随时间变化的针尖-样品力。这些力测量的准确性对于定量纳米力学测量很重要。在此，我们展示了一种利用轻敲悬臂梁的非线性动力学响应将扭转偏转信号转换为校准力波形的方法。具体而言，利用稳定振荡状态之间的转变来校准扭转偏转信号。