Lane Christopher D, Petrik Nikolay G, Orlando Thomas M, Kimmel Greg A
School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332-0400, USA.
J Chem Phys. 2007 Dec 14;127(22):224706. doi: 10.1063/1.2804767.
Electron-stimulated reactions in thin [<3 ML (monolayer)] water films adsorbed on TiO(2)(110) are investigated. Irradiation with 100 eV electrons results in electron-stimulated dissociation and electron-stimulated desorption (ESD) of adsorbed water molecules. The molecular water ESD yield increases linearly with water coverage theta for 0< or =theta< or =1 ML and 1<theta< or =2 ML. However, for theta>1 ML, the water ESD yield per additional water molecule adsorbed (i.e., the slope of the ESD yield versus coverage) is 3.5 times larger than for theta<1 ML. In contrast, the number of water molecules dissociated per incident electron increases linearly for theta< or =2 ML without changing slope at theta=1 ML. The total electron-stimulated sputtering rate, as measured by postirradiation temperature programmed desorption of the remaining water, is larger for theta>1 ML due to the increased water ESD for those coverages. The water ESD yields versus electron energy (for 5-50 eV) are qualitatively similar for 1, 2, and 40 ML water films. In each case, the observed ESD threshold is at approximately 10 eV and the yield increases monotonically with increasing electron energy. The results indicate that excitations in the adsorbed water layer are primarily responsible for the ESD in thin water films on TiO(2)(110). Experiments on "isotopically layered" films with D(2)O adsorbed on the Ti(4+) sites (D(2)O(Ti)) and H(2)O adsorbed on the bridging oxygen atoms (H(2)O(BBO)) demonstrate that increasing the water coverage above 1 ML rapidly suppresses the electron-stimulated desorption of D(2)O(Ti) and D atoms, despite the fact that the total water ESD and atomic hydrogen ESD yields increase with increasing coverage. The coverage dependence of the electron-stimulated reactions is probably related to the different bonding geometries for H(2)O(Ti) and H(2)O(BBO) and its influence on the desorption probability of the reaction products.
研究了吸附在TiO(2)(110)上的薄水膜(<3 ML(单层))中的电子激发反应。用100 eV电子辐照会导致吸附水分子的电子激发解离和电子激发脱附(ESD)。对于0≤θ≤1 ML和1<θ≤2 ML,分子水ESD产率随水覆盖率θ线性增加。然而,对于θ>1 ML,每吸附一个额外水分子的水ESD产率(即ESD产率与覆盖率的斜率)比θ<1 ML时大3.5倍。相反,对于θ≤2 ML,每个入射电子解离的水分子数线性增加,在θ = 1 ML时斜率不变。通过辐照后对剩余水进行程序升温脱附测量的总电子激发溅射率,对于θ>1 ML更大,这是因为这些覆盖率下的水ESD增加。对于1、2和40 ML的水膜,水ESD产率与电子能量(5 - 50 eV)的关系在定性上相似。在每种情况下,观察到的ESD阈值约为10 eV,产率随电子能量增加而单调增加。结果表明,吸附水层中的激发主要导致了TiO(2)(110)上薄水膜中的ESD。对在Ti(4+)位点吸附D(2)O(D(2)O(Ti))且在桥连氧原子上吸附H(2)O(H(2)O(BBO))的“同位素分层”膜进行的实验表明,尽管总水ESD和原子氢ESD产率随覆盖率增加,但将水覆盖率提高到1 ML以上会迅速抑制D(2)O(Ti)和D原子的电子激发脱附。电子激发反应的覆盖率依赖性可能与H(2)O(Ti)和H(2)O(BBO)的不同键合几何结构及其对反应产物脱附概率的影响有关。