Romisch S, Kitching J, Ferre-Pikal E, Hollberg L, Walls F L
Nat. Inst. of Stand. and Technol., Boulder, CO.
IEEE Trans Ultrason Ferroelectr Freq Control. 2000;47(5):1159-65. doi: 10.1109/58.869060.
Phase noise measurements of an optoelectronic oscillator (OEO) at frequencies less than 10 Ha from the carrier (10.6 GHz) as well as the measured Allan variance are presented for the first time. The system has a measured single-side-band (SSB) phase-noise of -123 dB/Hz at 10 kHz from the carrier and a sigma(y)(tau)=10(-10) for an integration time between 1 and 10 seconds. The importance of amplifier phase-noise and environmental fluctuations in determining the noise of the oscillator at these low Fourier frequencies is verified experimentally and analyzed using a generalized model of noise sources in the OEOs. This analysis then allows prediction of the oscillator performance from measured parameters of individual components in the system.
首次给出了光电振荡器（OEO）在距载波（10.6 GHz）小于10 Hz频率处的相位噪声测量结果以及测量得到的阿伦方差。该系统在距载波10 kHz处测得的单边带（SSB）相位噪声为-123 dB/Hz，在1至10秒的积分时间内，σ(y)(τ)=10^(-10)。通过实验验证了放大器相位噪声和环境波动在确定这些低傅里叶频率下振荡器噪声方面的重要性，并使用光电振荡器中噪声源的广义模型进行了分析。然后，这种分析使得能够根据系统中各个组件的测量参数预测振荡器性能。
