Lozano-Perez Sergio
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.
Micron. 2008;39(3):320-8. doi: 10.1016/j.micron.2007.12.003. Epub 2007 Dec 23.
The preparation of samples containing stress corrosion crack tips for 3D atom-probe tomography and transmission electron microscopy is of ultimate importance for understanding the mechanisms controlling crack propagation. In this paper, it will be shown that a focused ion beam machine equipped with an in situ micromanipulator is an ideal tool to systematically prepare such demanding samples. The methodology is described and discussed in detail, and several results are presented to demonstrate the potential of the technique.
制备用于三维原子探针断层扫描和透射电子显微镜的含应力腐蚀裂纹尖端的样品对于理解控制裂纹扩展的机制至关重要。本文将表明，配备原位微操纵器的聚焦离子束机器是系统制备此类高要求样品的理想工具。详细描述和讨论了该方法，并给出了几个结果以证明该技术的潜力。
